JPH0214792B2 - - Google Patents

Info

Publication number
JPH0214792B2
JPH0214792B2 JP55186868A JP18686880A JPH0214792B2 JP H0214792 B2 JPH0214792 B2 JP H0214792B2 JP 55186868 A JP55186868 A JP 55186868A JP 18686880 A JP18686880 A JP 18686880A JP H0214792 B2 JPH0214792 B2 JP H0214792B2
Authority
JP
Japan
Prior art keywords
transistor
gate
resistor
input terminal
mis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP55186868A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57109375A (en
Inventor
Shigenobu Taira
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55186868A priority Critical patent/JPS57109375A/ja
Priority to US06/327,693 priority patent/US4449158A/en
Priority to DE8181305915T priority patent/DE3175994D1/de
Priority to EP81305915A priority patent/EP0055552B1/en
Priority to IE3032/81A priority patent/IE52929B1/en
Publication of JPS57109375A publication Critical patent/JPS57109375A/ja
Publication of JPH0214792B2 publication Critical patent/JPH0214792B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
    • H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/52—Circuit arrangements for protecting such amplifiers
    • H03F1/523—Circuit arrangements for protecting such amplifiers for amplifiers using field-effect devices
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
    • H03K17/081—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit
    • H03K17/0812—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit by measures taken in the control circuit
    • H03K17/08122—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit by measures taken in the control circuit in field-effect transistor switches
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Protection Of Static Devices (AREA)
  • Amplifiers (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP55186868A 1980-12-26 1980-12-26 Mis type transistor protection circuit Granted JPS57109375A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP55186868A JPS57109375A (en) 1980-12-26 1980-12-26 Mis type transistor protection circuit
US06/327,693 US4449158A (en) 1980-12-26 1981-12-04 Input protection circuit for MIS transistor
DE8181305915T DE3175994D1 (en) 1980-12-26 1981-12-17 Input protection circuit for an mis transistor
EP81305915A EP0055552B1 (en) 1980-12-26 1981-12-17 Input protection circuit for an mis transistor
IE3032/81A IE52929B1 (en) 1980-12-26 1981-12-22 Inpit protection circuit for an mis transistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55186868A JPS57109375A (en) 1980-12-26 1980-12-26 Mis type transistor protection circuit

Publications (2)

Publication Number Publication Date
JPS57109375A JPS57109375A (en) 1982-07-07
JPH0214792B2 true JPH0214792B2 (en]) 1990-04-10

Family

ID=16196071

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55186868A Granted JPS57109375A (en) 1980-12-26 1980-12-26 Mis type transistor protection circuit

Country Status (5)

Country Link
US (1) US4449158A (en])
EP (1) EP0055552B1 (en])
JP (1) JPS57109375A (en])
DE (1) DE3175994D1 (en])
IE (1) IE52929B1 (en])

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1211141B (it) * 1981-12-04 1989-09-29 Ates Componenti Elettron Circuito limitatore-trasduttore disegnali in alternata codificati in forma binaria, come stadio d'ingresso di un circuito integrato a igfet.
US4786956A (en) * 1982-10-20 1988-11-22 North American Philips Corporation, Signetics Division Input protection device for integrated circuits
JPS6010765A (ja) * 1983-06-30 1985-01-19 Fujitsu Ltd 半導体装置
US4567388A (en) * 1983-10-03 1986-01-28 Motorola, Inc. Clamp circuit
JPS6066049U (ja) * 1983-10-12 1985-05-10 日本電気株式会社 Ｃ−ｍｏｓ型電界効果トランジスタ
US4605980A (en) * 1984-03-02 1986-08-12 Zilog, Inc. Integrated circuit high voltage protection
US4745450A (en) * 1984-03-02 1988-05-17 Zilog, Inc. Integrated circuit high voltage protection
DE3408285A1 (de) * 1984-03-07 1985-09-19 Telefunken electronic GmbH, 7100 Heilbronn Schutzanordnung fuer einen feldeffekttransistor
US4630162A (en) * 1984-07-31 1986-12-16 Texas Instruments Incorporated ESD input protection circuit
JPS61218143A (ja) * 1985-03-25 1986-09-27 Hitachi Ltd 半導体集積回路装置
IT1214606B (it) * 1985-05-13 1990-01-18 Ates Componenti Elettron Dispositivo integrato di protezione dinamica, in particolare per circuiti integrati con ingresso in tecnologia mos.
JPS6271275A (ja) * 1985-09-25 1987-04-01 Toshiba Corp 半導体集積回路
US4733168A (en) * 1986-03-21 1988-03-22 Harris Corporation Test enabling circuit for enabling overhead test circuitry in programmable devices
JPS6331157A (ja) * 1986-07-24 1988-02-09 Fujitsu Ltd Ｃ−ｍｏｓ　ｌｓｉの保護回路
JP2545527B2 (ja) * 1987-01-23 1996-10-23 沖電気工業株式会社 半導体装置
US4987465A (en) * 1987-01-29 1991-01-22 Advanced Micro Devices, Inc. Electro-static discharge protection device for CMOS integrated circuit inputs
JPS63198525A (ja) * 1987-02-12 1988-08-17 三菱電機株式会社 過電圧保護装置
JPS63244874A (ja) * 1987-03-31 1988-10-12 Toshiba Corp 入力保護回路
US4819047A (en) * 1987-05-15 1989-04-04 Advanced Micro Devices, Inc. Protection system for CMOS integrated circuits
US5210437A (en) * 1990-04-20 1993-05-11 Kabushiki Kaisha Toshiba MOS device having a well layer for controlling threshold voltage
US5111353A (en) * 1990-05-07 1992-05-05 Motorola, Inc. Overvoltage protection circuit
US5272586A (en) * 1991-01-29 1993-12-21 National Semiconductor Corporation Technique for improving ESD immunity
JPH0529160U (ja) * 1991-09-27 1993-04-16 シチズン時計株式会社 半導体装置の入力保護回路
JPH05121670A (ja) * 1991-10-25 1993-05-18 Nec Corp 半導体入力保護装置
DE69231494T2 (de) * 1991-12-27 2001-05-10 Texas Instruments Inc., Dallas Vorrichtung für ESD-Schutz
US5565692A (en) * 1995-01-12 1996-10-15 General Electric Company Insulated gate transistor electrostatic charge protection
JP2874583B2 (ja) * 1995-02-10 1999-03-24 日本電気株式会社 半導体装置の入力保護回路
EP1233453A3 (en) 2001-02-19 2005-03-23 Kawasaki Microelectronics, Inc. Semiconductor integrated circuit having anti-fuse, method of fabricating, and method of writing data in the same
JP2004247578A (ja) * 2003-02-14 2004-09-02 Kawasaki Microelectronics Kk 半導体装置および半導体装置の製造方法
US9466711B2 (en) * 2008-01-29 2016-10-11 Fuji Electric Co., Ltd. Semiconductor device
JP6185032B2 (ja) * 2015-09-30 2017-08-23 シャープ株式会社 半導体装置と、それを用いたインバータ、コンバータおよび電力変換装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3636385A (en) * 1970-02-13 1972-01-18 Ncr Co Protection circuit
DE2539890B2 (de) * 1975-09-08 1978-06-01 Siemens Ag, 1000 Berlin Und 8000 Muenchen Schaltungsanordnung zum Schutz von Eingängen integrierter MOS-Schaltkreise
JPS54136278A (en) * 1978-04-14 1979-10-23 Nec Corp Semiconductor device

Also Published As

Publication number Publication date
JPS57109375A (en) 1982-07-07
US4449158A (en) 1984-05-15
EP0055552A2 (en) 1982-07-07
DE3175994D1 (en) 1987-04-16
IE813032L (en) 1982-06-26
EP0055552A3 (en) 1983-06-01
EP0055552B1 (en) 1987-03-11
IE52929B1 (en) 1988-04-13

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